We can't find the internet
Attempting to reconnect
Something went wrong
Hang in there while we get back on track
£255.00
CRC Press Characterisation of Radiation Damage by Transmission Electron Microscopy (Series in Microscopy in Materials Science)
Price data last checked 24 day(s) ago - will refresh soon
We'll watch every seller, every day. One email when your price arrives.
This is the most expensive it has ever been. Walk away.
£255 today · previous high £255 · all-time low £221
NEW HERE?
Amazon shows you one price. We show you all of them.
Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.
WHAT'S ON THIS PAGE
when this has been cheap or pricey
where the price is heading next
all-time high & low, recent range
name your number, we'll email you
Price History & Forecast
Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.
Last 67 days · 67 data points (no recent data)
Price Distribution
Price distribution over 67 days • 2 price levels
Price Analysis
Most common price: £255 (42 days, 62.7%)
Price range: £221 - £255
Price levels: 2 different prices over 67 days
Description
Product Specifications
- Brand
- CRC Press
- Format
- hardcover
- ASIN
- 075030748X
- Domain
- Amazon UK
- Release Date
- 21 November 2000
- Listed Since
- 10 February 2007
Barcode
No barcode data available
Similar Products You Might Like
Transmission Electron Microscopy and Diffractometry of Materials (Graduate Texts in Physics)
Springer
Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience
Springer
Springer Radiation Effects in Semiconductor Materials & Devices
Springer
Topics in Electron Diffraction and Microscopy of Materials (Series in Microscopy in Materials Science)
CRC Press
Introduction to Conventional Transmission
Cambridge University Press
Transmission Electron Microscopy: Diffraction, Imaging, and Spectrometry
Springer
Transmission Electron Microscopy: Diffraction, Imaging, and Spectrometry
Springer
Electron Microscopy of Interfaces in Metals and Alloys (Series in Microscopy in Materials Science)
CRC Press
Structural and Chemical Characterization of Metals, Alloys, and Compounds – 2014: Volume 1766 (MRS Proceedings)
Cambridge University Press
Strain And Dislocation Gradients From Diffraction: Spatially-Resolved Local Structure And Defects
Imperial College Press
Springer High-Resolution Imaging and Spectrometry of Materials
Springer
IN-SITU ELECTRON MICROSCOPY AT HIGH RESOLUTION
World Scientific Publishing Company
High-Resolution Imaging and Spectrometry of Materials: 50 (Springer Series in Materials Science, 50)
Springer
Aberration-corrected Imaging In Transmission Electron Microscopy: An Introduction (2nd Edition)
Imperial College Press
Electron Microscopy and Analysis 1997, Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of ... 1997: 153 (Institute of Physics Conference)
CRC Press
Introduction to Analytical Electron Microscopy
Springer
Wiley In-situ Electron Microscopy - Physics and Chemistry Book
Wiley
Electron Microscopy and Analysis 2001: Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of ... 168 (Institute of Physics Conference Series)
CRC Press
X-Ray Metrology in Semiconductor Manufacturing
CRC Press
Progress in Transmission Electron Microscopy 1: Concepts and Techniques: 38 (Springer Series in Surface Sciences, 38)
Springer
Scanning Transmission Electron Microscopy: Advanced Characterization Methods for Materials Science Applications
CRC Press
Transmission Electron Microscopy: A Textbook for Materials Science
Springer
Radiation Effects in Semiconductors (Devices, Circuits, and Systems)
CRC Press
Atomic-Scale Analytical Tomography: Concepts and Implications (Advances in Microscopy and Microanalysis)
Cambridge University Press