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Springer High-Resolution Imaging and Spectrometry of Materials - Springer Series 50

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Description

This comprehensive volume explores the essential characterisation techniques required in modern materials science, focusing on how material properties depend critically on microstructure at the atomic level. The book addresses the fundamental need to determine the position and nature of individual atoms at critical regions near defects such as dislocations, interfaces, and surfaces. It examines the transformative impact of advanced transmission electron microscopy (TEM) techniques in materials characterisation, providing detailed coverage of imaging and spectrometry methods that enable researchers and practitioners to understand material systems at unprecedented resolution and precision.

Key Features

Covers atomic-level characterisation essential for understanding how material properties relate to microstructure and component composition.

Focuses on advanced transmission electron microscopy (TEM) techniques and their applications in materials science research.

Addresses critical examination of defects including dislocations, interfaces, and surfaces using high-resolution imaging methods.

Part of the established Springer Series in Materials Science, providing authoritative content for academic and professional audiences.

Product Specifications

Format
hardcover
Domain
Amazon UK
Release Date
11 December 2002
Listed Since
22 December 2006

Barcode

No barcode data available

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