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Springer High-Resolution Imaging and Spectrometry of Materials

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Description

The characterisation of materials and material systems is an essential aspect of materials science. This volume from the Springer Series in Materials Science explores why material properties depend on microstructure and why characterisation must reach the atomic level. To understand material behavior, researchers must determine the position and nature of individual atoms in critical regions. This book addresses the need to examine areas close to defects, such as dislocations, interfaces, and surfaces. It covers the impact of advanced transmission electron microscopy (TEM) techniques in these specialized areas of study. This text serves as a resource for those studying analytical chemistry and materials science, providing depth on how advanced imaging and spectrometry techniques allow for precise atomic-level analysis. It is a necessary addition to any scientific library focused on the structural properties of matter.

Key Features

Covers the essential role of material characterisation in modern materials science research.

Explains the necessity of atomic-level determination to understand material properties.

Focuses on identifying the position and nature of individual atoms in critical regions.

Provides insight into studying defects such as dislocations, interfaces, and surfaces.

Discusses the impact of advanced transmission electron microscopy (TEM) techniques.

Part of the Springer Series in Materials Science, Volume 50.

Product Specifications

Format
Hardcover
Domain
Amazon UK
Release Date
11 December 2002
Listed Since
22 December 2006

Barcode

No barcode data available

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