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£129.99
Springer High-Resolution Imaging and Spectrometry of Materials
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Description
Key Features
Covers the essential role of material characterisation in modern materials science research.
Explains the necessity of atomic-level determination to understand material properties.
Focuses on identifying the position and nature of individual atoms in critical regions.
Provides insight into studying defects such as dislocations, interfaces, and surfaces.
Discusses the impact of advanced transmission electron microscopy (TEM) techniques.
Part of the Springer Series in Materials Science, Volume 50.
Product Specifications
- Brand
- Springer
- Format
- Hardcover
- ASIN
- 3540418180
- Domain
- Amazon UK
- Release Date
- 11 December 2002
- Listed Since
- 22 December 2006
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No barcode data available
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