Scaling Effects on Metal-oxide-semiconductor Device Characteristics - Image 1

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Dissertation Discovery Company Scaling Effects on Metal-oxide-semiconductor Device Characteristics

Name: Scaling Effects on Metal-oxide-semiconductor Device Characteristics
Brand: Dissertation Discovery Company
Price: 67.91 GBP
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Electrical Engineering

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Dissertation Discovery Company and University of Florida are dedicated to making scholarly works more discoverable and accessible throughout the world. This dissertation, "Scaling Effects on Metal-oxide-semiconductor Device Characteristics" by Steven V. Walstra, was obtained from University of Florida and is being sold with permission from the author. A digital copy of this work may also be found in the university's institutional repository, IR@UF. The content of this dissertation has not been altered in any way. We have altered the formatting in order to facilitate the ease of printing and reading of the dissertation.

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Brand: Dissertation Discovery Company
Format: hardcover
ASIN: 0530002337
Category: Books > Subjects > Science, Nature & Maths > Engineering & Technology > Electrical > Electrical Engineering
Domain: Amazon UK
Release Date: 31 May 2019
Listed Since: 01 June 2019

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