Inorganic Mass Spectrometry (Chemical Analysis: A Series of Monographs on Analytical Chemistry and Its Applications)

Product Description Also from the Wiley Series in Chemical Analysis. Secondary Ion Mass Spectroscopy Basic Concepts, Instrumental Aspects, Applications and Trends A. Benninghoven and H. W. Werner Virtually a handbook on this important analytical technique, here is the most thorough presentation of secondary ion mass spectrometry (SIMS) ever compiled. Surveys basic concepts of SIMS applications and supplies a comprehensive review of techniques and instrumentation, including detailed guidance for application and analysis. 1987 (0 471–01056–1) 1,227 pp. Inductively Coupled Plasma Emission Spectroscopy Parts 1 & 2 Edited by P. W.J. Boumans Parts 1 and 2 of this book comprise Volume 90 in Chemical Analysis: A Series of Monographs on Analytical Chemistry and Its Applications. Part 1: Methodology, Instrumentation, and Performance covers the basis of ICP–AES as an analytical method and discusses fundamental analytical concepts, performance, and figures of merit. It compares the relationship between ICP and other modern "plasma sources" and the connection between ICP–AES, on one hand, and ICP atomic fluorescence spectroscopy and ICP mass spectroscopy on the other. Part 2: Applications and Fundamentals, covers applications in the major fields of interest: metals and industrial materials, organics, agriculture and food, biological, and environmental. Also addresses in a fundamental way aerosol generation and the properties of plasmas. Part 1: 1987 (0 471–09686–5) 432 pp. Part 2: 1987 (0 471–85378–X) 486 pp. From the Inside Flap This new volume in the Wiley Series in Chemical Analysis represents the most exhaustive survey of inorganic mass spectrometry published to date. Bringing together the expertise of twelve acknowledged authorities in the field, Inorganic Mass Spectrometry provides the analytical, material, and mass scientist with a comprehensive range of current spectrometric techniques for sensitive elemental trace analysis of liquids and solids, both in the bulk and in localized surfaces, interfaces, and micro domains. Also, in light of the spectacular advances that have been made in developing new ionization sources, instruments, and applications, the book gives scientists and researchers a keen appreciation of current developments in a practical, applications–based context. Many of the techniques discussed such as secondary ion mass spectrometry and spark source mass spectrometry have been in existence for some time. The discussion of spark source methods focuses on the vacuum spark discharge and describes capabilities for semi–micro, local, and in–depth analysis. A chapter treating new commercial instrumentation for the spatial analysis and imaging capabilities of secondary ion mass spec reveals this well–known technique to be one of surprising sensitivity. It has recently undergone significant growth and revitalization. Other techniques covered such as the use of glow–discharge ion sources, inductively coupled plasma source mass spec, and mass spec methods using lasers as ion sources are relatively new. Here, readers will find coverage of state–of–the–art instruments and approaches, including the laser microprobe mass analyzer, supported by fundamental principles of interaction, ionization, detection and analysis. Isotope dilution mass spectrometry, probably the most accurate inorganic trace analysis technique in use today, is also examined in detail. The book concludes with a look at emerging trends and future developments in the field from accelerator–based mass spec and laser–assisted mass spec, to image analysis in secondary ion mass spectrometry. Inorganic Mass Spectrometry provides an outstanding, systematic survey of basic concepts and applications for analytical chemists, spectro–scientists, physical chemists, and physicists. From the Back Cover Also from the Wiley Series in Chemical Analysis Secondary Ion Mass Spectroscopy Basic Concepts, Instrumental Aspects, Applications and Trends A. Benninghoven and H. W