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Elsevier In-Situ Characterisation of Thin Film Growth - Woodhead Publishing
Illustrations
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Description
Key Features
Electron diffraction techniques section provides comprehensive methodology for taking accurate observations and measurements during thin film characterisation.
Photoemission techniques coverage explains both fundamental principles and practical instrumentation requirements for in-situ thin film analysis.
Alternative in-situ characterisation techniques are explored in part three to give readers multiple approaches to real-time deposition monitoring.
Published by Woodhead Publishing as part of their recognised Woodhead Publishing Series in Electronic and Optical Materials.
Enables improved understanding of deposition processes and faster diagnosis of issues that arise during thin film growth.
Product Specifications
- Brand
- Elsevier
- Model
- Illustrations
- Format
- hardcover
- ASIN
- 1845699343
- Domain
- Amazon UK
- Release Date
- 05 October 2011
- Listed Since
- 21 December 2010
Barcode
No barcode data available
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