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Springer Structure and Electronic Properties of Ultrathin In Films on Si(111)

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Description

This Springer Theses volume examines the structural characteristics and electronic behaviour of ultrathin indium films deposited on silicon substrates. The research explores the fundamental properties that emerge at the nanoscale interface between indium and silicon, providing detailed analysis of how film thickness influences electronic structure and surface phenomena. This scholarly work combines experimental investigation with theoretical understanding, making it essential for researchers in materials science, condensed matter physics, and semiconductor technology who seek comprehensive knowledge of metal-on-semiconductor systems and their applications in advanced electronic devices.

Key Features

Springer Theses publication offering peer-reviewed research on ultrathin In films and their electronic properties.

Detailed examination of structure-property relationships at the In and Si(111) interface.

Essential reference for materials scientists working with metal films and silicon-based systems.

Product Specifications

Format
paperback
Domain
Amazon UK
Release Date
10 November 2023
Listed Since
14 October 2023

Barcode

No barcode data available

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