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Springer - Introduction to Statistics in Metrology Book

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Description

Master the application of statistical methods to metrology through this comprehensive guide from Springer. This book provides a clear overview of how to model measurement processes and quantify associated uncertainties. Whether you are studying fundamentals or exploring advanced special topics, this text offers the technical foundation needed to succeed in various metrology contexts. Every concept is supported by practical case studies drawn from the authors' work within the Nuclear Security Enterprise (NSE). This real-world approach helps readers understand how to apply statistical techniques to complex measurement problems. The material is designed to build a solid understanding of measurement science, specifically focusing on uncertainty in decision making and the design of experiments. This volume is an essential resource for professionals and students looking to bridge the gap between statistical theory and practical metrology applications.

Key Features

Covers fundamental statistical methods and advanced special topics for a complete understanding of metrology applications.

Includes practical case studies from the Nuclear Security Enterprise (NSE) to illustrate complex theoretical concepts.

Focuses on modeling measurement processes and providing accurate quantification of associated uncertainties.

Provides guidance on uncertainty in decision making and the design of experiments for scientific studies.

Offers versatile techniques that can be applied to metrology studies across a wide variety of professional contexts.

Product Specifications

Format
hardcover
Domain
Amazon UK
Release Date
01 December 2020
Listed Since
10 June 2020

Barcode

No barcode data available

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