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£95.43
Springer Fowler-Nordheim Field Emission in Semiconductors
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Description
Key Features
Comprehensive study of Fowler-Nordheim field emission specifically within semiconductors and their nanostructures.
Detailed analysis of diverse materials including III-V, II-VI, Ge, Te, and carbon nanotubes.
Covers complex structures like HgTe/CdTe superlattices with graded interfaces and effective mass superlattices.
Examines the effects of magnetic quantization on superlattices and quantum wires.
Includes specialized research on FNFE in opto-electronic materials when studied in the presence of light.
Part of the authoritative Springer Series in Solid-State Sciences for technical reference.
Product Specifications
- Brand
- Springer
- Format
- hardcover
- ASIN
- 3642204929
- Domain
- Amazon UK
- Release Date
- 13 January 2012
- Listed Since
- 21 March 2011
Barcode
No barcode data available
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