£95.97

Springer Efficient Test Methodologies for High-Speed Serial Links

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Description

Improve your understanding of high-speed interface testing with Efficient Test Methodologies for High-Speed Serial Links. Published by Springer as part of the Lecture Notes in Electrical Engineering series, this book provides a detailed look at new and promising techniques designed to test high-speed interfaces cost-effectively while maintaining high test coverage. A major focus of this work is the development of efficient testing methods for jitter and bit-error-rate (BER). These metrics are essential for quantifying the quality of any modern communication system. By studying these methodologies, engineers and researchers can better manage the complexities of high-speed data transmission. The text includes various analysis and experimental results to demonstrate the validity of the presented techniques. This resource serves as a practical guide for those working in computer science architecture and microprocessors who require reliable methods for evaluating communication system performance.

Key Features

Provides detailed descriptions of new and promising techniques for cost-effective testing of high-speed interfaces.

Focuses on efficient testing methods for jitter and bit-error-rate (BER) to quantify communication system quality.

Includes various analysis and experimental results to demonstrate the practical validity of the presented techniques.

Offers high test coverage solutions for engineers working with high-speed serial links.

Part of the Lecture Notes in Electrical Engineering series (Volume 51) from Springer.

Product Specifications

Format
paperback
Domain
Amazon UK
Release Date
01 March 2012
Listed Since
02 March 2012

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