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Springer Applied Scanning Probe Methods XI - NanoScience Book

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Description

Applied Scanning Probe Methods XI: Scanning Probe Microscopy Techniques provides essential insights into the measurement of nanoscale materials, devices, and systems. As the US National Nanotechnology Initiative notes, the ability to accurately and reproducibly measure properties and performance characteristics is a requirement for progress in fundamental nanoscience. This volume addresses the growing need for measurement tools in emerging nanomaterial applications, a field expected to grow into a multibillion-dollar market. This text focuses on the technical requirements for characterizing new nanomaterials and manufacturing nanoscale products. A specific area of focus includes the need for nanomechanical information and knowledge regarding these materials. This book serves as a resource for those working in the design and development of next-generation nanoscale technologies and systems.

Key Features

Covers the measurement of properties and performance characteristics for nanoscale materials, devices, and systems.

Addresses the technical needs of emerging nanomaterial applications within the nanoscience field.

Focuses on the requirements for accurate and reproducible measurement in nanotechnology.

Provides information relevant to the design and manufacturing of new nanoscale products.

Explores specific measurement needs, including nanomechanical information and knowledge.

Product Specifications

Format
hardcover
Domain
Amazon UK
Release Date
04 November 2008
Listed Since
23 July 2008

Barcode

No barcode data available

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