£62.17

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£62 today · all-time low £60 (Aug 2026) · usually £62

Springer Applied Scanning Probe Methods XI - NanoScience Book

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Description

Applied Scanning Probe Methods XI: Scanning Probe Microscopy Techniques provides essential knowledge for researchers in the NanoScience and Technology field. As noted by the US National Nanotechnology Initiative, the ability to measure properties and performance characteristics of nanoscale materials and devices is a requirement for progress in fundamental nanoscience and the design of new materials. This volume addresses the urgent need for measurement tools in emerging nanomaterial applications, specifically focusing on the demand for nanomechanical information. This text serves as a resource for those working toward the manufacturing of new nanoscale products and exploring the multibillion-dollar market of nanotechnology.

Key Features

This Springer publication covers advanced Scanning Probe Microscopy Techniques within the NanoScience and Technology series.

The text addresses the measurement of properties and performance characteristics for nanoscale materials, devices, and systems.

Content focuses on the need for nanomechanical information in emerging nanomaterial applications.

This resource supports progress in fundamental nanoscience and the design of new nanomaterials.

Product Specifications

Format
hardcover
Domain
Amazon UK
Release Date
04 November 2008
Listed Since
23 July 2008

Barcode

No barcode data available

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