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Optical and Infrared Interferometry III - SPIE Press Book

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Description

Expand your technical library with Optical and Infrared Interferometry III. This specialized volume captures the proceedings from the conference held from 1-6 July 2012 in Amsterdam, Netherlands. Published by SPIE Press, this book serves as a dedicated resource for professionals and students working within the fields of applied optics and engineering technology. This publication is categorized under Electronics and Communications Engineering, making it a relevant addition for those focused on electronics engineering and applied optics. By providing documented insights from the Amsterdam sessions, it offers a structured look at the developments present during the 2012 conference. It is a practical tool for researchers and engineers seeking documented technical content related to optical and infrared interferometry.

Key Features

Covers proceedings from the 1-6 July 2012 conference held in Amsterdam, Netherlands.

Published by SPIE Press, a recognized name in technical and scientific literature.

Provides technical content relevant to the field of applied optics.

Suitable for readers specializing in electronics and communications engineering.

Serves as a reference for studies in electronics engineering and optical technologies.

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