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Optical and Infrared Interferometry III - SPIE 2012

Applied Optics

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Description

Optical and Infrared Interferometry III documents the proceedings from the SPIE conference held 1-6 July 2012 in Amsterdam, Netherlands. This comprehensive volume collects papers presented by leading researchers and engineers working at the forefront of optical and infrared interferometry techniques and applications. The proceedings cover advances in interferometric methods, instrumental design, data processing algorithms, and real-world implementations across astronomy, metrology, and related fields. Engineers, physicists, and researchers in optics and applied photonics will find detailed technical discussions, experimental results, and innovations from this specialised conference. The collection serves as a valuable reference for understanding the state of interferometry research during this period and offers insights into methodologies still relevant to modern optical engineering. Readers seeking comprehensive coverage of interferometric advances from 2012 will benefit from the diverse expert contributions assembled in this SPIE publication.

Key Features

SPIE conference proceedings from the 1-6 July 2012 Amsterdam meeting on optical and infrared interferometry techniques.

Covers applied optics and interferometry research presented by leading experts in the field during July 2012.

Comprehensive reference for optical engineers and researchers studying interferometric methods and instrumentation.

Documents advances in infrared interferometry applicable to astronomy, metrology, and optical engineering disciplines.

Published by SPIE Press, the authority on optical engineering technical documentation and peer-reviewed research proceedings.

Product Specifications

Format: paperback
ASIN: 0819491462
Category: Books > Subjects > Science, Nature & Maths > Engineering & Technology > Electronics & Communications Engineering > Electronics Engineering > Applied Optics
Domain: Amazon UK
Release Date: 15 August 2012
Listed Since: 10 November 2012

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Optical and Infrared Interferometry III - SPIE 2012

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