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Elsevier Internal Photoemission Spectroscopy: Fundamentals and Recent Advances

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Description

The second edition of Internal Photoemission Spectroscopy by Elsevier provides a comprehensive and updated guide to internal photoemission (IPE) phenomena and measurement techniques. This practical resource combines foundational coverage of the physical and technical aspects of IPE spectroscopic applications with an extensive overview of recent experimental results in rapidly advancing research fields. The book addresses critical developments in insulating materials for advanced SiMOS technology, metal gate materials, heterostructures based on high-mobility semiconductors, and band structure analysis. Ideal for researchers, engineers, and academics working in semiconductor physics, materials science, and analytical spectroscopy, this second edition reflects the latest innovations and findings in the field.

Key Features

Internal Photoemission Spectroscopy covers both fundamental principles and recent advances in IPE measurement techniques and applications.

The second edition includes extended coverage of insulating materials for advanced SiMOS technology and metal gate material development.

This Elsevier resource addresses heterostructures based on high-mobility semiconductors and related band structure phenomena.

Combines practical spectroscopic guidance with current experimental results from swiftly advancing research fields in semiconductor physics.

Product Specifications

Format
hardcover
Domain
Amazon UK
Release Date
01 March 2014
Listed Since
02 October 2013

Barcode

No barcode data available

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