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CRC Press - Through Silicon Vias: Materials, Models, Design

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Description

Stay at the forefront of semiconductor technology with Through Silicon Vias: Materials, Models, Design, and Performance. As vertical interconnect access (via) technology continues to evolve, this book offers a deep look into the theory and recent advancements of through silicon vias (TSV). This technical resource covers essential developments in materials, models, and designs. It provides detailed electrical equivalent models for various configurations, including Copper (Cu), carbon nanotube (CNT), and graphene nanoribbon (GNR) based TSVs. By exploring these different geometries and physical configurations, readers can gain a clear understanding of how these materials perform in modern architectures. Whether you are studying semiconductor theory or looking for performance comparisons between Cu, CNT, and GNR based TSVs, this CRC Press publication serves as a comprehensive guide for professionals and students in computer science and microprocessor architecture.

Key Features

Comprehensive review of TSV theory and recent semiconductor technology advancements.

Detailed coverage of modern materials, models, and design methods for vertical interconnect access.

Provides electrical equivalent models for Cu, carbon nanotube (CNT), and graphene nanoribbon (GNR) based TSVs.

Includes performance comparisons between Cu, CNT, and GNR based TSVs based on electrical models.

Explores how different geometries and physical configurations impact TSV performance.

Product Specifications

Format
hardcover
Domain
Amazon UK
Release Date
06 September 2016
Listed Since
16 February 2016

Barcode

No barcode data available

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