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CRC Press Silicon Nanoelectronics - Optical Science & Engineering

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Description

As conventional transistor scaling approaches physical limits, the semiconductor industry faces significant challenges. This text from CRC Press explores the transition from traditional scaling to new technological frontiers. It addresses critical issues such as quantum fluctuation errors that occur when active regions contain fewer than ten electrons or holes. The book also examines the problems of unacceptable leakage caused by quantum mechanical tunneling when gate insulator thickness becomes too small. By focusing on optical science and engineering, this work provides insight into the new windows of opportunity opening in the field of nanoelectronics as traditional chip development methods reach their boundaries.

Key Features

This CRC Press publication focuses on the field of optical science and engineering within nanoelectronics.

The text addresses technical challenges in chip development caused by the downscaling of transistor feature sizes.

Readers can learn about quantum fluctuation errors that occur in devices with fewer than ten electrons or holes.

The content explains the physics of quantum mechanical tunneling and gate insulator leakage in modern semiconductors.

This book explores new technological paths as conventional scaling methods approach their physical limits.

Product Specifications

Format
hardcover
Domain
Amazon UK
Release Date
27 June 2005
Listed Since
10 February 2007

Barcode

No barcode data available

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