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Self-Testing for Microelectronic circuits in semiconductor industries: Testing compact circuits in modern electronics

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Description

VLSI microelectronics testing is used to identify faulty integrated circuits and to guarantee the quality of fault-free circuits. The testing strategy depends on the type of circuit (combinational circuits, sequential circuits, memory circuits). In the first part of this book, the focus is on path delay fault testing of combinational circuits as well as special functional memory circuits. In the second part, the issue of adapting BIST techniques in combinational circuits (ex: Arithmetic BIST), and memory circuits (ex: Static RAM BIST, and Content addressable Memory BIST) are addressed. This book Provides comprehensive knowledge to delay testing and its potential impact on the semiconductor industry. Equips VLSI engineers with tools for identifying delay defects from a circuit design and built-in self-test perspective Describe state-of-the art techniques for microelectronics circuit design and testing

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