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World Scientific Publishing Company Terrestrial Neutron-Induced Soft Errors In Advanced Memory Devices

Name: Terrestrial Neutron-Induced Soft Errors In Advanced Memory Devices
Brand: World Scientific Publishing Company
Price: 98.0 GBP
Availability: InStock

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Description

Terrestrial neutron-induced soft errors in semiconductor memory devices are currently a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of semiconductor memory devices. This book covers the relevant up-to-date topics in terrestrial neutron-induced soft errors, and aims to provide succinct knowledge on neutron-induced soft errors to the readers by presenting several valuable and unique features.

Product Specifications

Brand: World Scientific Publishing Company
Format: paperback
ASIN: B00MWRS22C
Category: Books > Subjects
Domain: Amazon UK
Release Date: 28 March 2008
Listed Since: 21 August 2014

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World Scientific Publishing Company Terrestrial Neutron-Induced Soft Errors In Advanced Memory Devices

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It has never been this cheap. We have no record of a lower price.

World Scientific Publishing Company Terrestrial Neutron-Induced Soft Errors In Advanced Memory Devices

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Price Distribution

Price Analysis

Description

Product Specifications

Similar Products You Might Like

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Mechanics Of Functional Materials

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High-Performance Construction Materials: Science And Applications

Modeling, Computation And Optimization

Advances In Digital Document Processing And Retrieval

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Mathematical Foundations Of Nonextensive Statistical Mechanics

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