TERRESTRIAL NEUTRON-INDUCED SOFT ERROR IN ADVANCED MEMORY DEVICES - Image 1

£72.99

World Scientific Publishing Company TERRESTRIAL NEUTRON-INDUCED SOFT ERROR IN ADVANCED MEMORY DEVICES

Name: TERRESTRIAL NEUTRON-INDUCED SOFT ERROR IN ADVANCED MEMORY DEVICES
Brand: World Scientific Publishing Company
Price: 70.0 GBP
Availability: InStock

black & white tables, figures

Peripherals

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Description

Terrestrial neutron-induced soft errors in semiconductor memory devices are currently a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of semiconductor memory devices. This book covers the relevant up-to-date topics in terrestrial neutron-induced soft errors, and aims to provide succinct knowledge on neutron-induced soft errors to the readers by presenting several valuable and unique features.

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Product Specifications

Brand: World Scientific Publishing Company
Model: black & white tables, figures
Format: hardcover
ASIN: 9812778810
Category: Books > Subjects > Computing & Internet > Hardware & DIY > Peripherals
Domain: Amazon UK
Release Date: 22 June 2008
Listed Since: 30 October 2007

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World Scientific Publishing Company TERRESTRIAL NEUTRON-INDUCED SOFT ERROR IN ADVANCED MEMORY DEVICES

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