Springer Applications of Microscopy in Materials and Life Sciences: Proceedings of 12th Asia-Pacific Microscopy Conference: 11 (Springer Proceedings in Materials, 11)

This book comprises the proceedings of the 12th International Conference on Asia-Pacific Microscopy Conference (APMC12) focusing on emerging opportunities and challenges in the field of materials sciences, life sciences and microscopy techniques. The contents of this volume include papers on aberration corrected TEM & STEM, SEM – FIB, ion beam microscopy, electron diffraction & crystallography, microscopy and imaging associated with bio-nanotechnology, medical applications, host-pathogen interaction, etc. This book will be beneficial to researchers, educators, and practitioners alike. From the Back Cover This book comprises the proceedings of the 12th International Conference on Asia-Pacific Microscopy Conference (APMC12) focusing on emerging opportunities and challenges in the field of materials sciences, life sciences and microscopy techniques. The contents of this volume include papers on aberration corrected TEM & STEM, SEM – FIB, ion beam microscopy, electron diffraction & crystallography, microscopy and imaging associated with bio-nanotechnology, medical applications, host-pathogen interaction, etc. This book will be beneficial to researchers, educators, and practitioners alike. About the Author Dr. Partha Ghosal is a senior Scientist G in DMRL, Hyderabad and is heading the Electron Microscopy Group. He received his Ph.D. from Indian Institute of Technology (IIT-BHU), Varanasi in the field of Metallurgical Engineering in 1996 and worked on the effect of crystal defects in the diffraction theory for ordered HCP alloys. He spent one year as DAAD visiting scientist in TU Clausthal, Germany to work on EBSD techniques. Currently, he is working in the area of advanced characterization techniques, along with SEM, EBSD, FIB, TEM, HRTEM and Raman-AFM systems. His current interests include in-situ mechanical testing and heating experiments of nano and advanced materials inside electron microscopes and advanced Raman analysis for these materials. Extensive electron microscopic works on Ti-based alloys, W-based alloys and nano-composites are also in the scope of his interest. He is involved in establishing an advanced materials characterization centre for the country at DRDO. He has around 146 international papers, over 100 invited presentations and 3 patents to his credit. He is a fellow of EMSI with 25 years of research experience. He is member of Electron Crystallography (IUCr) from India. He is reviewer of 11 reputed international journals and life member of professional national bodies such as IIM, MRSI, EMSI and MSI. Dr. C. Barry Carter is a Research Professor and Emeritus Professor at the University of Connecticut, USA. He holds a B.A., M.A. and Sc.D. from Cambridge University, an M.Sc. from Imperial College, London, and a D.Phil. from Oxford University. After 6 years in Oxford, he moved to Cornell where he spent 14 years leaving as a full Professor. He spent 16 years as Professor and the 3M Endowed Multidisciplinary Chair in the Department of Chemical Engineering and Materials Science at the University of Minnesota and 5 years as Head of UConn’s Department of Chemical, Materials and Biomolecular Engineering. He is a CINT Distinguished Affiliate Scientist at Sandia National Lab. He had earlier held visiting positions at LANL, Chalmers, NIMS in Tsukuba, Bristol University, Max Planck Institute in Stuttgart, the Institute for Physical Chemistry in Hanover and the Ernst Ruska Center in Jülich. He has been awarded a Guggenheim Fellowship and the Alexander von Humboldt Senior Award. He is the Editor-in-Chief of the Journal of Materials Science, a journal cited more than 55,099 times in 2019 and 2 million downloads in 2020. His research interests focus on the application of different microscopies to understand how the structure and chemistry of materials determine their properties and behavior. He works on several projects including a study of the deformation of Ta and its growth in