Springer Progress in Nanoscale Characterization and Manipulation: 272 (Springer Tracts in Modern Physics, 272)

This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research. The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field. From the Back Cover This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research. The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field. About the Author Rongming WANG received his Bachelor and Master’s Degrees in Physics from Peking University and Ph. D. in Materials Science from Beijing Institute of Aeronautical Materials, China. In 2004-2005, he was a visiting scholar in University of California, Berkeley. Then he joined Beihang University as a Professor in physics. Currently, he is a professor in University of Science and Technology Beijing and director of Beijing Key Laboratory for Magneto-Photoelectrical Composite and Interface Science. His research interests include magnetic nanomaterial, transmission electron microscopy and interface science. Prof. Rongming Wang has published over 200 articles including Phys. Rev. Lett., Adv. Mater., J. Am. Chem. Soc., Angew. Chim. Int. Edit., Nano Lett. etc. and presented over 60 invited talks in international and national conferences, universities and institutes. The papers have been cited over 6,000 time citations by SCI journals and citation H factor of 43. He has won several awards including National Prize for Natural Sciences, Scientific Chinese Prize for People of the Year 2012, State Council Expert for Special Allowance, etc.   Chen Wang received his B.S. degree from University of Science and Technology of China in 1986. After obtaining PhD degree from University of Virginia in 1992, he joined Arizona State University as a postdoctoral associate. In 1994, he became a professor of Central China Normal University. He was a faculty of the Institute of Chemistry, Chinese Academy of Sciences from 1995 to 2004, and is currently a professor of National Center for Nanoscience and Technology of China. Research in the Wang’s group focuses on many aspects of surface physical chemistry and nano-bio interface, including the principle of scanning tunneling microscopy and its applications, nanoscale physical and chemical phenomena at interface, and molecular self-assembly, and single molecule physics and chemistry, etc. Wang and