Design for Manufacturability and Yield for Nano-Scale CMOS (Integrated Circuits and Systems) - Image 1

£73.85

Springer Design for Manufacturability and Yield for Nano-Scale CMOS (Integrated Circuits and Systems)

Name: Design for Manufacturability and Yield for Nano-Scale CMOS (Integrated Circuits and Systems)
Brand: Springer
Price: 72.62 GBP
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Architecture & Microprocessors

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Description

Manufacturability and yield are no longer a fabrication, packaging, and test concerns. They are aspects that have to be designed in, and they are everybody’s responsibility. Design for Manufacturability and Yield for Nano-Scale CMOS walks the reader through all the aspects of manufacturability and yield in a nano-CMOS process and how to address each aspect at the proper design step starting with the layout of standard cells and how to yield-grade libraries for critical area and lithography artifacts through place and route, CMP model based simulation and dummy-fill insertion, and through statistical timing closure of the design. It alerts the designer to the pitfalls to watch for and to the good practices that can enhance a design’s manufacturability and yield. A must read book for the serious designer.

Product Specifications

Brand: Springer
Format: paperback
ASIN: 9048173035
Category: Books > Subjects > Computing & Internet > Computer Science > Architecture & Microprocessors
Domain: Amazon UK
Release Date: 22 November 2010
Listed Since: 20 September 2010

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Springer Design for Manufacturability and Yield for Nano-Scale CMOS (Integrated Circuits and Systems)

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