RF and Microwave Measurements: device characterization, signal integrity and spectrum analysis - Image 1

£79.60

ASTM Analysis, Simulation, Test and Measurement Sa RF and Microwave Measurements: device characterization, signal integrity and spectrum analysis

Name: RF and Microwave Measurements: device characterization, signal integrity and spectrum analysis
Brand: ASTM Analysis, Simulation, Test and Measurement Sa
Price: 79.6 GBP
Availability: InStock

Engineering & Technology

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Description

RF and microwave measurements are common to many disciplines and engineering areas: device and PCB characterization and testing, EMI and EMC, and signal integrity, during design, prototyping and production phases. Measurement setups and procedures are more and more complex and demanding in terms of accuracy, performance, flexibility. Methods and techniques are often borrowed from other domains, including signal processing and probability theory. Mastering the whole process has thus become challenging for the variety and breadth of the required skills and experience. This book attacks the problem from two sides: reviewing circuits and transmission lines, signal analysis, random processes and statistics, and then considering the main experimental setup elements (cables, connectors and PCBs). Two chapters are for the Spectrum Analyzer and the Vector Network Analyzer, their settings, operation, calibration and verification. The objective is supporting R&D and test engineers, academic staff and students: references were thoroughly examined and practical examples conceived to support theory and allow autonomous repetition and verification.

Product Specifications

Brand: ASTM Analysis, Simulation, Test and Measurement Sa
Format: paperback
ASIN: 8894109100
Category: Books > Subjects > Science, Nature & Maths > Engineering & Technology
Domain: Amazon UK
Release Date: 27 August 2015
Listed Since: 22 October 2015

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ASTM Analysis, Simulation, Test and Measurement Sa RF and Microwave Measurements: device characterization, signal integrity and spectrum analysis

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