Automated Model-based Test Generation for Timed Systems: An overview about models, specification languages and test generation approaches considering time constraintes - Image 1

£59.00

LAP Lambert Academic Publishing Automated Model-based Test Generation for Timed Systems: An overview about models, specification languages and test generation approaches considering time constraintes

Name: Automated Model-based Test Generation for Timed Systems: An overview about models, specification languages and test generation approaches considering time constraintes
Brand: LAP Lambert Academic Publishing
Price: 59.0 GBP
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Description

Model-based test generation is an approach to generate test cases based on a formal model. Although test generation methods have long existed, its timed counterpart is still a new field. In addition, most of the proposed solutions suffer from combinatory explosion which continues to limit their applicability in practice. Accordingly, it explains why there are so few automatic formal methods for testing generation, for both time and untimed systems. This book presents an overview about models, specification languages and test generation approches adressed to timed systems. In addition, it proposes a test generation approach using test-purposes and considering timed constraints. In order to evaluate the applicability and efficiency of the proposed method, two real industrial applications are used as case studies: a Railroad Crossing and a Vocal Service furnished by France Telecom.

Product Specifications

Brand: LAP Lambert Academic Publishing
Format: Paperback
ASIN: 3838355849
Category: Books > Subjects > Computing & Internet
Domain: Amazon UK
Release Date: 03 May 2010
Listed Since: 05 May 2010

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LAP Lambert Academic Publishing Automated Model-based Test Generation for Timed Systems: An overview about models, specification languages and test generation approaches considering time constraintes

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