Single Electron Spin Measurements in Submicron Si MOS-FETs: Random Telegraph Signal, Single Electron Spin Resonance - Image 1

£54.00

VDM Verlag Single Electron Spin Measurements in Submicron Si MOS-FETs: Random Telegraph Signal, Single Electron Spin Resonance

Name: Single Electron Spin Measurements in Submicron Si MOS-FETs: Random Telegraph Signal, Single Electron Spin Resonance
Brand: VDM Verlag
Price: 54.0 GBP
Availability: InStock

Physics

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Product Specifications

Brand: VDM Verlag
Format: paperback
ASIN: 3836493756
Category: Books > Subjects > Science, Nature & Maths > Physics
Domain: Amazon UK
Release Date: 18 December 2008
Listed Since: 29 December 2008

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VDM Verlag Single Electron Spin Measurements in Submicron Si MOS-FETs: Random Telegraph Signal, Single Electron Spin Resonance

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