Étude expérimentale des dégradations des transistors N-MOS: induites par des radiations ionisantes (rayons X) - Image 1

£78.00

ÉDITIONS UNIVERSITAIRES EUROPÉENNES Étude expérimentale des dégradations des transistors N-MOS: induites par des radiations ionisantes (rayons X)

Electronics Engineering

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Product Specifications

Brand: ÉDITIONS UNIVERSITAIRES EUROPÉENNES
Format: paperback
ASIN: 3659558044
Category: Books > Subjects > Science, Nature & Maths > Engineering & Technology > Electronics & Communications Engineering > Electronics Engineering
Domain: Amazon UK
Release Date: 21 January 2019
Listed Since: 18 February 2019

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ÉDITIONS UNIVERSITAIRES EUROPÉENNES Étude expérimentale des dégradations des transistors N-MOS: induites par des radiations ionisantes (rayons X)

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