We can't find the internet
Attempting to reconnect
Something went wrong
Hang in there while we get back on track
£76.42
It has never been this cheap. We have no record of a lower price.
£76 today · cheaper than every other day in the last 3 months
Springer Gas Source Molecular Beam Epitaxy: Growth and Properties of Phosphorus Containing III-V Heterostructures: 26 (Springer Series in Materials Science, 26)
We'll watch every seller, every day. One email when your price arrives.
Price History & Forecast
Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.
Last 20 days · 20 data points (no recent data)
NEW HERE?
Amazon shows you one price. We show you all of them.
Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.
WHAT'S ON THIS PAGE
when this has been cheap or pricey
where the price is heading next
all-time high & low, recent range
name your number, we'll email you
Price Distribution
Price distribution over 20 days • 1 price levels
Price Analysis
Most common price: £76 (20 days, 100.0%)
Price range: £76 - £76
Price levels: 1 different prices over 20 days
Description
Product Specifications
- Brand
- Springer
- Format
- paperback
- ASIN
- 3642781292
- Domain
- Amazon UK
- Release Date
- 30 December 2011
- Listed Since
- 13 July 2012
Barcode
No barcode data available
Similar Products You Might Like
Molecular Beam Epitaxy of III–V Compounds: A Comprehensive Bibliography 1958–1983
Springer
Growth Processes and Surface Phase Equilibria in Molecular Beam Epitaxy: 156 (Springer Tracts in Modern Physics, 156)
Springer
Cathodoluminescence Microscopy of Inorganic Solids
Springer
Design and Realization of Novel GaAs Based Laser Concepts (Springer Theses)
Springer
Molecular Beam Epitaxy (Key Papers in Physics)
American Institute of Physics
Optics of Semiconductors and Their Nanostructures: 146 (Springer Series in Solid-State Sciences, 146)
Springer
Advances in the Application of Lasers in Materials Science: 274 (Springer Series in Materials Science, 274)
Springer
Metalorganic Vapor Phase Epitaxy (MOVPE): Growth, Materials Properties, and Applications (Wiley Series in Materials for Electronic & Optoelectronic Applications)
Wiley
Coherent Light Microscopy: Imaging and Quantitative Phase Analysis: 46 (Springer Series in Surface Sciences, 46)
Springer
Optoelectronic Properties of Inorganic Compounds (Modern Inorganic Chemistry)
Springer
Optics of Semiconductors and Their Nanostructures: 146 (Springer Series in Solid-State Sciences, 146)
Springer
Organic and Hybrid Photonic Crystals
Springer
X-Ray Absorption Spectroscopy of Semiconductors: 190 (Springer Series in Optical Sciences, 190)
Springer
Nanocomposites as Next-Generation Optical Materials: Fundamentals, Design and Advanced Applications: 316 (Springer Series in Materials Science, 316)
Springer
Metal Impurities in Silicon- and Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact: 270 (Springer Series in Materials Science, 270)
Springer
Nanostructured Materials and Their Applications (NanoScience and Technology)
Springer
Semiconductor Nanostructures for Optoelectronic Devices: Processing, Characterization and Applications (NanoScience and Technology)
Springer
Advanced Transmission Electron Microscopy: Applications to Nanomaterials
Springer
Einstein's Photoemission: Emission from Heavily-Doped Quantized Structures: 262 (Springer Tracts in Modern Physics, 262)
Springer
Epitaxial Growth of Complex Metal Oxides (Woodhead Publishing Series in Electronic and Optical Materials)
Elsevier
GaN and ZnO-based Materials and Devices: 156 (Springer Series in Materials Science, 156)
Springer
Active Glass for Photonic Devices: Photoinduced Structures and Their Application: 7 (Springer Series in Photonics, 7)
Springer
Photoelectron Spectroscopy: Bulk and Surface Electronic Structures: 176 (Springer Series in Optical Sciences)
Springer
In-situ Materials Characterization: Across Spatial and Temporal Scales: 193 (Springer Series in Materials Science, 193)
Springer