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Springer Applied Scanning Probe Methods XI: Scanning Probe Microscopy Techniques (NanoScience and Technology)

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Description

The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a timely comprehensive overview of SPM applications. Real industrial applications are included.

Product Specifications

Format
paperback
Domain
Amazon UK
Release Date
16 November 2010
Listed Since
13 October 2010

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