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VDM Verlag Test Techniques for System-on-Chip: Problems and solutions

Name: Test Techniques for System-on-Chip: Problems and solutions
Brand: VDM Verlag
Price: 53.0 GBP
Availability: InStock

Electronics Engineering

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Description

Fast innovation in VLSI technologies makes possible the integration of a complete system into a single chip (System-on-Chip, or SoC). In order to handle the resulting design complexity, reusable modules (called cores) are being used in many SoC applications. System designers can purchase cores from core vendors and integrate them with their own User-Defined Logic (UDL) to implement SoCs. Core-based SoCs show important advantages: design re- use guarantees lower end-product cost and reduced time-to-market, but introduces new constructive criticalities whose impact on production yield is not negligible and that make test procedures more complex. This raises the need for new suitable manufacturing test strategies. This work addresses System-on-Chip test cost reduction and provides the description and evaluation of a set of hardware structures, software tools and, in general, test techniques oriented to SoCs needs. Solutions for accurate SoC diagnosis are also part of the work.

Product Specifications

Brand: VDM Verlag
Format: paperback
ASIN: 3639207483
Category: Books > Subjects > Science, Nature & Maths > Engineering & Technology > Electronics & Communications Engineering > Electronics Engineering
Domain: Amazon UK
Release Date: 04 November 2009
Listed Since: 09 November 2009

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VDM Verlag Test Techniques for System-on-Chip: Problems and solutions

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Similar Products You Might Like

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