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VDM Verlag Ion Time-of-Flight Spectrometer: Development of an Ion Time-of-Flight Spectrometer for Neutron Depth Profiling

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Description

Ion time-of-flight spectrometry techniques are investigated for potential application to neutron depth profiling. Time-of-flight techniques are used extensively in a wide range of scientific and technological applications including energy and mass spectroscopy. Ion time-of-flight spectrometry offers highly precise measurement capabilities, particularly for slow particles. Time-of-flight spectrometry involves correlated detection of two signals by a coincidence unit. In ion time-of-flight spectroscopy, the ion generates the primary input signal. The secondary signal can be obtained by a number of ways. In this work, the secondary signal is created by the passage of the primary ion through a thin carbon foil. Two ion time-of-flight spectrometer design paradigms are introduced: the parallel electric and magnetic (PEM) field spectrometer and the cross electric and magnetic (CEM) field spectrometer.

Product Specifications

Format
paperback
Domain
Amazon UK
Release Date
02 December 2008
Listed Since
05 December 2008

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No barcode data available

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