£159.39

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Springer Noncontact Atomic Force Microscopy (NanoScience and Technology)

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£182.44 £157.08 £162.62 £168.15 £173.68 £179.21 £184.75 12 August 2026 20 August 2026 28 August 2026 05 September 2026 14 September 2026
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Price distribution over 34 days • 3 price levels

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1 day · current 25 days 8 days 0 6 13 19 25 £159 £166 £182 Days at Price

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Most common price: £166 (25 days, 73.5%)

Price range: £159 - £182

Price levels: 3 different prices over 34 days

Description

Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.

Product Specifications

Format
hardcover
Domain
Amazon UK
Release Date
24 July 2002
Listed Since
22 January 2007

Barcode

No barcode data available

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