£77.34

About as cheap as it gets — within 5% of the all-time low it hit 3 months ago.

£77 today · all-time low £76 (Jul 2026) · usually the usual

Springer Design for Testability, Debug and Reliability: Next Generation Measures Using Formal Techniques

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£80.77 £75.83 £76.91 £77.99 £79.06 £80.14 £81.22 25 July 2026 07 August 2026 21 August 2026 04 September 2026 18 September 2026
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Description

This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications. The authors describe new measures to address the rising challenges in the field of design for testability, debug, and reliability, as strictly required for state-of-the-art circuit designs. In particular, this book combines formal techniques, such as the Satisfiability (SAT) problem and the Bounded Model Checking (BMC), to address the arising challenges concerning the increase in test data volume, as well as test application time and the required reliability. All methods are discussed in detail and evaluated extensively, while considering industry-relevant benchmark candidates. All measures have been integrated into a common framework, which implements standardized software/hardware interfaces.

Product Specifications

Format
paperback
Domain
Amazon UK
Release Date
20 April 2022
Listed Since
25 March 2022

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