Elsevier Advanced Laser Diode Reliability (Durability, Robustness and Reliability of Photonic Devices)

Product Description Advanced Laser Diode Reliability focuses on causes and effects of degradations of state-of-the-art semiconductor laser diodes. It aims to provide a tool for linking practical measurements to physical diagnostics. The book reviews the current technologies, addressing their peculiar details that can promote specific failure mechanisms. Two sections support this kernel: a) failure analysis techniques, procedures and examples; and, b) device-oriented laser modeling and parameter extraction. Provides natural continuity with the most widespread existing textbooks Offers an extension to new failure mechanisms, new technologies, new application fields and new environments Introduces a specific self-consistent model for the physical description of a laser diode, expressed in terms of practically measurable quantities Introduces and explores the application of a practical measurement tool for linking failure modes to failure mechanisms Review Defines Failure Physics of Semiconductor Laser Diodes: modes and mechanisms. Device-level modelling for parameter extraction and measurement new protocols About the Author Massimo Vanzi was graduated in Physics at the University of Bologna in 1978. From 1980 to 1992 he worked at Telettra S.p.A. on studying reliability issue of semiconductor electronic circuits and analytical techniques development required from these activities. On 1992 he became Associated Professor of Solid State Electronics at the Electronic Engineering Course of the University of Cagliari. Since then, he focused his work on Reliability, by means of much cooperation with European Labs, like ETH Zurich, IXL Bordeaux, Fraunhofer inst. Darmstadt. Particular efforts have been spent on photonic devices, within cooperation with Pirelli Cavi, Milan. Since October 2001 he is Full Professor of Electronics. M. Vanzi's research topics are the physical and electrical characterization of semiconductor electronic devices and the physics mechanism of failures discovered.Laurent Bechou is full Professor at the University of Bordeaux, France, and has worked for the last 5 years in IMS laboratory. He is responsible for the “Assessment of Micro-Nano Devices and Assemblies (EDMiNA in French) team. He is also the Head of "Evaluation of Micro and Nano-Assemblied Devices" Research Group.Mitsuo Fukuda is Senior Research Engineer and Supervisor at Optoelectronics Laboratories, NTT-a world-leading telecommunications company. Dr. Fukuda is the author of Reliability and Degradation of Semiconductor Lasers and LEDs.Giovanna Mura is an Assistant Professor at DIEE, Department of Electrical and Electronic Engineering at the University of Cagliari with expertise in Electronic Engineering, Optics, Solid State Physics