Backscattering from Multiscale Rough Surfaces with Application to Wind Scatterometry - Image 1

£76.12

Artech House Backscattering from Multiscale Rough Surfaces with Application to Wind Scatterometry

Name: Backscattering from Multiscale Rough Surfaces with Application to Wind Scatterometry
Brand: Artech House
Price: 76.12 GBP
Availability: InStock

Environmental

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Description

This resource explains and demonstrates the backscattering properties of multiscale rough surfaces, and illustrates their application to establish the geophysical model function (GMF) needed in wind scatterometry. This book also explains how the mechanisms of backscattering change with frequency and the incident angle on a multiscale surface and how to recognize single scale versus multiscale surfaces. Very useful information for those wanting to use backscattering models more efficiently. About the Author Adrian K. Fung was previously the director of the Wave Scattering Research Center and Jenkins Garrett professor of electrical engineering, and a member of the Academy of Distinguished Scholars at the University of Texas at Arlington. Dr. Fung is also a life fellow of the Institute of Electrical and Electronic Engineers and a member of U.S. Commission F of the International Scientific Radio Union. He earned his Ph.D. from the University of Kansas, Lawrence.

Product Specifications

Brand: Artech House
Format: hardcover
ASIN: 1630810002
Category: Books > Subjects > Science, Nature & Maths > Engineering & Technology > Civil Engineering > Environmental
Domain: Amazon UK
Release Date: 30 June 2015
Listed Since: 10 February 2015

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Artech House Backscattering from Multiscale Rough Surfaces with Application to Wind Scatterometry

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