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Springer Test and Diagnosis for Small-Delay Defects

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Description

This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.

Product Specifications

Format
paperback
Domain
Amazon UK
Release Date
28 November 2014
Listed Since
02 December 2014

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No barcode data available

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