£84.99

Springer Test and Diagnosis for Small-Delay Defects

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Description

This book introduces new techniques for detecting and diagnosing small-delay defects in integrated circuits. It details effective and scalable methodologies for screening and diagnosing small-delay defects.

Product Specifications

Format
paperback
Domain
Amazon UK
Release Date
28 November 2014
Listed Since
02 December 2014

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