X-Ray Spectrometry in Electron Beam Instruments - Image 1

£146.72

Springer X-Ray Spectrometry in Electron Beam Instruments

Name: X-Ray Spectrometry in Electron Beam Instruments
Brand: Springer
Price: 146.72 GBP
Availability: InStock

Analytical Chemistry

This is the usual price. Wait for it to drop, or tell us your number.

£147 today · usual range £0–£0 · best ever £127

NEW HERE?

Amazon shows you one price. We show you all of them.

Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.

WHAT'S ON THIS PAGE

↓ Price chart
when this has been cheap or pricey

↓ Forecast
where the price is heading next

↓ Statistics
all-time high & low, recent range

↑ Price alert
name your number, we'll email you

Price History & Forecast

Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.

Last 638 days • 638 data points (No recent data available)

Historical

Generating forecast...

Price Distribution

Price distribution over 638 days • 8 price levels

Days at Price

Current Price

Price Analysis

Most common price: £139 (242 days, 37.9%)

Price range: £127 - £149

Price levels: 8 different prices over 638 days

Description

Review `[A] rich and authoritative collection of papers, which have both a historical and an up-to-the-minute dimension.' from the Foreword by Peter Duncumb, University of Cambridge, England `Contains a vast amount of detailed information and will surely be heavily used.' Ultramicroscopy Product Description From its early days in the 1950s, the electron microanalyzer has offered two principal ways of obtaining x-ray spectra: wavelength dispersive spectrometry (WDS), which utilizes crystal diffraction, and energy dispersive spectrometry (EDS), in which the x-ray quantum energy is measured directly. In general, WDS offers much better peak separation for complex line spectra, whereas EDS gives a higher collection efficiency and is easier and cheaper to use. Both techniques have undergone major transformations since those early days, from the simple focusing spectrometerand gas proportional counter of the 1950s to the advanced semiconductor detectors and programmable spectrometersoftoday. Becauseofthesedevelopments, thecapabilities and relative merits of EDS and WDS techniques have been a recurring feature of microprobeconferences for nearly40 years, and this volume bringstogetherthepapers presented at the Chuck Fiori Memorial Symposium, held at the Microbeam Analysis Society Meeting of 1993. Several themes are apparent in this rich and authoritative collection of papers, which have both a historical and an up-to-the-minute dimension. Light element analysis has long been a goal of microprobe analysts since Ray Dolby first detected K radiation with a gas proportional counter in 1960. WDS techniques (using carbon lead stearate films) were not used for this purpose until four years later. Now synthetic multilayers provide the best dispersive elements for quantitative light element analy sis-still used in conjunction with a gas counter.

Product Specifications

Brand: Springer
Format: Paperback
ASIN: 1461357381
Category: Books > Subjects > Science, Nature & Maths > Chemistry > Analytical Chemistry
Domain: Amazon UK
Publication Date: 21 October 2012
Listed Since: 20 September 2013

Barcode

No barcode data available

Springer X-Ray Spectrometry in Electron Beam Instruments

This is the usual price. Wait for it to drop, or tell us your number.

Price History & Forecast

Price Distribution

Price Analysis

Description

Product Specifications

Barcode

Similar Products You Might Like

Compound Semiconductor Radiation Detectors (Series in Sensors)

Two-dimensional X-ray Diffraction

X-Ray Optics: High-Energy-Resolution Applications: 98 (Springer Series in Optical Sciences, 98)

Nuclear Track Detectors: Design, Methods & Applications (Electrical Engineering Developments Series)

Radiation Physics: Mathematics for Ionizing Energy: Hands on with Python (Nuclear Engineering Essentials)

X-Ray Fluorescence Spectrometry: 212 (Chemical Analysis: A Series of Monographs on Analytical Chemistry and Its Applications)

Physics and Engineering of Radiation Detection

Academic Press Advances in Atomic, Molecular, and Optical Physics

Radiation Detection: Concepts, Methods, and Devices

Radiation Physics for Medical Physicists (Graduate Texts in Physics)

Advances in Atomic, Molecular, and Optical Physics: 58 (Advances in Atomic, Molecular, & Optical Physics): Volume 58

Optical Technologies for Extreme-Ultraviolet and Soft X-ray Coherent Sources: 197 (Springer Series in Optical Sciences, 197)

Advances in X-Ray Analysis: Volume 15

Advances in Atomic, Molecular, and Optical Physics (Volume 62)

A Practical Guide for the Preparation of Specimens for X-Ray Fluorescence and X-Ray Diffraction Analysis (Statistics)

Ionization and Plasma Dynamics of Single Large Xenon Clusters in Superintense XUV Pulses (Springer Theses)

CRC Press - A Century of Excellence in Measurements and Standards

Si Detectors and Characterization for HEP and Photon Science Experiment: How to Design Detectors by TCAD Simulation

Uniting Electron Crystallography and Powder Diffraction (NATO Science for Peace and Security Series B: Physics and Biophysics)

X-Ray Radiation of Highly Charged Ions: 19 (Springer Series on Atomic, Optical, and Plasma Physics, 19)

X-Ray Fluorescence Spectroscopy for Laboratory Applications

Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis

Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis

Parametric X-Ray Radiation in Crystals: Theory, Experiment and Applications: 213 (Springer Tracts in Modern Physics)