Functional Design Errors in Digital Circuits: Diagnosis Correction and Repair: 32 (Lecture Notes in Electrical Engineering, 32) - Image 1

£105.43

Springer Functional Design Errors in Digital Circuits: Diagnosis Correction and Repair: 32 (Lecture Notes in Electrical Engineering, 32)

Name: Functional Design Errors in Digital Circuits: Diagnosis Correction and Repair: 32 (Lecture Notes in Electrical Engineering, 32)
Brand: Springer
Price: 105.43 GBP
Availability: InStock

Architecture & Microprocessors

This is the usual price. Wait for it to drop, or tell us your number.

£105 today · usual range £0–£0 · best ever £80

NEW HERE?

Amazon shows you one price. We show you all of them.

Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.

WHAT'S ON THIS PAGE

↓ Price chart
when this has been cheap or pricey

↓ Forecast
where the price is heading next

↓ Statistics
all-time high & low, recent range

↑ Price alert
name your number, we'll email you

Price History & Forecast

Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.

Last 639 days • 639 data points (No recent data available)

Historical

Generating forecast...

Price Distribution

Price distribution over 639 days • 4 price ranges

Days at Price

Current Price

Price Analysis

Most common range: £93-100 (376 days, 58.8%)

Price range: £80 - £112

Price levels: 4 price ranges over 639 days

Description

Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices. From the Back Cover Due to the dramatic increase in design complexity, modern circuits are often produced with functional errors. While improvements in verification allow engineers to find more errors, fixing these errors remains a manual and challenging task. Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. In addition, Functional Design Errors in Digital Circuits Diagnosis describes a comprehensive evaluation of spare-cell insertion methods. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices. About the Author Winner of the EDAA (European Design Automation Association) Outstanding Monograph Award in the Verification section. Co-authors Bertacco and Markov are existing Springer authors

Key Features

Used Book in Good Condition

Product Specifications

Brand: Springer
Format: Hardcover
ASIN: 1402093640
Category: Books > Subjects > Computing & Internet > Computer Science > Architecture & Microprocessors
Domain: Amazon UK
Release Date: 10 December 2008
Listed Since: 01 October 2008

Barcode

No barcode data available

Springer Functional Design Errors in Digital Circuits: Diagnosis Correction and Repair: 32 (Lecture Notes in Electrical Engineering, 32)

This is the usual price. Wait for it to drop, or tell us your number.

Price History & Forecast

Price Distribution

Price Analysis

Description

Key Features

Product Specifications

Barcode

Similar Products You Might Like

Robustness and Usability in Modern Design Flows

Advanced Circuits for Emerging Technologies

Springer Hybrid ADCs and Smart Sensors for IoT Design Book

Practical ESD Protection Design

Electronic Components: Selection and Application Guidelines

Testing of Interposer-Based 2.5D Integrated Circuits

Design of Reconfigurable Logic Controllers: 45 (Studies in Systems, Decision and Control)

CRC Press Low Power Circuits for Emerging Applications Book

Design Automation for Field-coupled Nanotechnologies

Electronic Design Automation for IC System Design, Verification, and Testing

Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs

Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits (Devices, Circuits, and Systems)

Technology Mapping for LUT-Based FPGA: 713 (Lecture Notes in Electrical Engineering, 713)

Proceedings of the Fourth International Conference on Microelectronics, Computing and Communication Systems: MCCS 2019: 673 (Lecture Notes in Electrical Engineering, 673)

Statistical Analysis and Optimization for VLSI: Timing and Power (Integrated Circuits and Systems)

Selected Advances in Nanoelectronic Devices: Logic, Memory and RF: 175 (Lecture Notes in Electrical Engineering, 175)

Electronic Design Automation for IC Implementation, Circuit Design, and Process Technology (Electronic Design Automation for Integrated Circuits Handbook)

Proceeding of the Second International Conference on Microelectronics, Computing & Communication Systems (MCCS 2017): 476 (Lecture Notes in Electrical Engineering, 476)

Proceedings of the Third International Conference on Microelectronics, Computing and Communication Systems: MCCS 2018: 556 (Lecture Notes in Electrical Engineering, 556)

Formal System Verification: State-of the-Art and Future Trends

Proceedings of the Fourth International Conference on Microelectronics, Computing and Communication Systems: MCCS 2019: 673 (Lecture Notes in Electrical Engineering, 673)

Logic Design of NanoICS (Nano- and Microscience, Engineering, Technology and Medicine)

Counterfeit Integrated Circuits: Detection and Avoidance

On the Learnability of Physically Unclonable Functions (T-Labs Series in Telecommunication Services)