We can't find the internet
Attempting to reconnect
Something went wrong!
Hang in there while we get back on track
£160.19
Springer Defects in HIgh-k Gate Dielectric Stacks: Nano-Electronic Semiconductor Devices: 220 (NATO Science Series II: Mathematics, Physics and Chemistry, 220)
Price data last checked 39 day(s) ago - refreshing...
We'll watch every seller, every day. One email when your price arrives.
About as cheap as it gets. The only time it was cheaper was 2 months ago.
£160 today · all-time low £160 (May 2026) · usually the usual
NEW HERE?
Amazon shows you one price. We show you all of them.
Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.
WHAT'S ON THIS PAGE
when this has been cheap or pricey
where the price is heading next
all-time high & low, recent range
name your number, we'll email you
Price History & Forecast
Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.
Last 52 days • 52 data points (No recent data available)
Price Distribution
Price distribution over 52 days • 2 price levels
Price Analysis
Most common price: £160 (48 days, 92.3%)
Price range: £160 - £161
Price levels: 2 different prices over 52 days
Description
Product Specifications
- Brand
- Springer
- Format
- paperback
- ASIN
- 140204366X
- Domain
- Amazon UK
- Release Date
- 27 January 2006
- Listed Since
- 16 February 2007
Barcode
No barcode data available
Similar Products You Might Like
Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment: Proceedings of the NATO Advanced ... II: Mathematics, Physics and Chemistry, 185)
Springer
Materials Fundamentals of Gate Dielectrics
Springer
Electron Correlation in New Materials and Nanosystems: 241 (NATO Science Series II: Mathematics, Physics and Chemistry, 241)
Springer
High Permittivity Gate Dielectric Materials: 43 (Springer Series in Advanced Microelectronics, 43)
Springer
Surface Chemistry in Biomedical and Environmental Science: 228 (NATO Science Series II: Mathematics, Physics and Chemistry, 228)
Springer
Optical Properties of Semiconductors: 228 (NATO Science Series E:, 228)
Springer
Devices Based on Low-Dimensional Semiconductor Structures: 14 (NATO Science Partnership Subseries: 3, 14)
Springer
Low Dimensional Structures Prepared by Epitaxial Growth or Regrowth on Patterned Substrates: (Closed)): 298 (NATO Science Series E:)
Springer
Fundamentals of III-V Semiconductor MOSFETs
Springer
Low-Dimensional Structures in Semiconductors: From Basic Physics to Applications: 281 (NATO Science Series B:, 281)
Springer
Physics of Nonlinear Transport in Semiconductors: 52 (NATO Science Series B:, 52)
Springer
The Physics of Submicron Semiconductor Devices: (Closed)): 180 (NATO Science Series B:)
Springer
Semiconductor-On-Insulator Materials for Nanoelectronics Applications (Engineering Materials)
Springer
Debye Screening Length: Effects of Nanostructured Materials: 255 (Springer Tracts in Modern Physics, 255)
Springer
Nanosources and Manipulation of Atoms Under High Fields and Temperatures: Applications: 235 (NATO Science Series C)
Springer
Debye Screening Length: Effects of Nanostructured Materials: 255 (Springer Tracts in Modern Physics)
Springer
Silicon-based Nanomaterials: 187 (Springer Series in Materials Science, 187)
Springer
Advanced Gate Stacks for High-Mobility Semiconductors: 27 (Springer Series in Advanced Microelectronics, 27)
Springer
Size Effects in Nanostructures: Basics and Applications: 205 (Springer Series in Materials Science, 205)
Springer
Polarization Effects in Semiconductors: From Ab Initio Theory to Device Applications
Springer
Robust Computing with Nano-scale Devices: Progresses and Challenges: 58 (Lecture Notes in Electrical Engineering, 58)
Springer
The Physics and Chemistry of SiO2 and the Si-SiO2 Interface
Springer
Metal-Dielectric Interfaces in Gigascale Electronics: Thermal and Electrical Stability: 157 (Springer Series in Materials Science, 157)
Springer
Metal Impurities in Silicon- and Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact: 270 (Springer Series in Materials Science, 270)
Springer