CRC Press Chemical Process Performance Evaluation (Chemical Industries)

Product Description The latest advances in process monitoring, data analysis, and control systems are increasingly useful for maintaining the safety, flexibility, and environmental compliance of industrial manufacturing operations. Focusing on continuous, multivariate processes, Chemical Process Performance Evaluation introduces statistical methods and modeling techniques for process monitoring, performance evaluation, and fault diagnosis.This book introduces practical multivariate statistical methods and empirical modeling development techniques, such as principal components regression, partial least squares regression, input-output modeling, state-space modeling, and modeling process signals for trend analysis. Then the authors examine fault diagnosis techniques based on episodes, hidden Markov models, contribution plots, discriminant analysis, and support vector machines. They address controller process evaluation and sensor failure detection, including methods for differentiating between sensor failures and process upset. The book concludes with an extensive discussion on the use of data analysis techniques for the special case of web and sheet processes. Case studies illustrate the implementation of methods presented throughout the book.Emphasizing the balance between practice and theory, Chemical Process Performance Evaluation is an excellent tool for comparing alternative techniques for process monitoring, signal modeling, and process diagnosis. The unique integration of process and controller monitoring and fault diagnosis facilitates the practical implementation of unified and automated monitoring and diagnosis technologies. Review "Most texts that attempt to combine SPC or SPM (statistical process monitoring) with automated control methods fail to incorporate multivariate methods as well. This text does an excellent job of covering all the bases in that regard . . . I highly recommend this text for chemical engineers and statisticians interested in learning how statistical methods can be integrated with process control methods." – Dean V. Neubauer, Corning Inc., in Technometrics, February 2008, Vol. 50, No. 1 About the Author Illinois Institute of Technology, Chicago, USA University of California, Davis, USA Integrated Engineering Technologies, Tacoma, Washington, USA