Geospatial Infofusion III (Proceedings of SPIE): No. 8747

Image Reconstruction from Incomplete Data: Pt. IV (Proceedings of SPIE): 4

Complex Light and Optical Forces III (Proceedings of SPIE): v. 7227

Unmanned Systems Technology XI (Proceedings of SPIE): v. 7332

Smart Materials V (Proceedings of SPIE): v. 7267

Smart Structures, Devices, and Systems IV (Proceedings of SPIE): v. 7268

Smart Biomedical and Physiological Sensor Technology VI (Proceedings of SPIE): v. 7313

Advanced Materials and Devices for Sensing and Imaging III: 3 (Proceedings of SPIE)

Media Forensics and Security (Proceedings of SPIE): v. 7254

VLSI Circuits and Systems IV (Proceedings of SPIE): v. 7363

Micromachining and Microfabrication Process Technology XIV (Proceedings of SPIE): v. 7204

Design for Manufacturability Through Design-process Integration III (Proceedings of SPIE): v. 7275

International Conference on Optical Instruments and Technology 2008: Optical Systems and Optoelectronic Instruments (Proceedings of Spie)

Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VII: 7 (Proceedings of SPIE)

Diffuse Optical Imaging III (The International Society for Optical Engineering Proceedings of SPIE): 8088

Optical Diagnostics and Sensing IX (Proceedings of SPIE): v. 7186

International Conference on Optical Instruments and Technology 2008: Microelectronic and Optoelectronic Devices and Integration (Proceedings of Spie)

Advanced Signal Processing Algorithms, Architectures and Implementations: Pt. XVI (Proceedings of SPIE)

Stereoscopic Displays and Applications XX (Proceedings of SPIE): v. 7237

Recent Advances in Computer Science and Information Engineering: Volume 3: 126 (Lecture Notes in Electrical Engineering, 126)

Springer

Optoelectronic Interconnects XIII: 3-6 February 2013, San Francisco, California, United States (Proceedings of SPIE)

Automatic Target Recognition XXIII (Proceedings of SPIE): No. 8744

Geographical Information Science: Case Studies in Earth and Environmental Monitoring

Elsevier

Optical Pattern Recognition XX (Proceedings of SPIE): v. 7340

Non-intrusive Inspection Technologies: 6213 (Proceedings of SPIE)