We can't find the internet
Attempting to reconnect
Something went wrong
Hang in there while we get back on track
£155.00
International Conference on Image Processing and Pattern Recognition in Industrial Engineering: 7-8 August 2010, Xi'an, China
Price data last checked 50 day(s) ago - refreshing...
We'll watch every seller, every day. One email when your price arrives.
It has never been this cheap. We have no record of a lower price.
£155 today · cheaper than every other day in the last 3 months
NEW HERE?
Amazon shows you one price. We show you all of them.
Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.
WHAT'S ON THIS PAGE
when this has been cheap or pricey
where the price is heading next
all-time high & low, recent range
name your number, we'll email you
Price History & Forecast
Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.
Last 41 days · 41 data points (no recent data)
Price Distribution
Price distribution over 41 days • 1 price levels
Price Analysis
Most common price: £155 (41 days, 100.0%)
Price range: £155 - £155
Price levels: 1 different prices over 41 days
Product Specifications
- Format
- paperback
- ASIN
- 081948329X
- Domain
- Amazon UK
- Release Date
- 15 September 2010
- Listed Since
- 21 May 2012
Barcode
No barcode data available
Similar Products You Might Like
International Optical Design Conference 2010
Remote Sensing of the Environment: The 17th China Conference on Remote Sensing 27-31 August 2010 Hangzhou, China
Electro-Optical and Infrared Systems: Technology and Applications VII: 21-23 September 2010, Toulouse, France
Image Processing: Machine Vision Applications IV: 25-27 January 2011, San Francisco, California, United States (Proceedings of SPIE)
Fourth International Seminar on Modern Cutting and Measurement Engineering: 10-12 December 2010, Beijing, China
Quantum and Nonlinear Optics: 18-19 October 2010, Beijing, China
Optics and Photonics for Information Processing IV: Volume IV (Optics and Photonics for Information Processing: 4-5 August 2010, San Diego, California, United States)
Fifth International Conference on Machine Vision (ICMV) 2012: Algorithms, Pattern Recognition, and Basic Technologies 20-21 April 2012, Wuhan, China (Proceedings of SPIE)
Metamaterials: Fundamentals and Applications III : 1-5 August 2010, San Diego, California, United States
Fourth International Conference on Digital Image Processing: ICDIP 2012: 7-8 April 2012
Next Generation (nano) Photonic and Cell Technologies for Solar Energy Conversion: 1-4 August 2010, San Diego, California, United States
Dimensional Optical Metrology and Inspection for Practical Applications: 22-23 August 2011, San Diego, California, United States
Nanobiosystems: Processing, Characterization, and Applications III: 4-5 August 2010, San Diego, California, United States
Speckle 2010: Optical Metrology :13-15 September 2010, Florianaopolis, Brazil
Fifth International Conference on Machine Vision (ICMV) 2012: Computer Vision, Image Analysis and Processing, 20-21 April 2012 Wuhan, China (Proceedings of SPIE)
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXII : 26-28 April 2011, Orlando Florida, United States
Photomask Technology 2010: 13-16 September 2010, Monterey, California, United States
Optoelectronic Imaging and Multimedia Technology II: 5-7 November 2012, Beijing, China (Proceedings of SPIE): No. 8558
4th International Conference on Photonics and Imaging in Biology and Medicine (Proceedings of SPIE)
Image Processing: Machine Vision Applications (Proceedings of SPIE)
Image Processing: Machine Vision Applications VI: 5-6 February 2013, Burlingame, California, United States (Proceedings of SPIE): No. 8661
Medical Imaging 2010: Biomedical Applications in Molecular, Structural, and Functional Imaging
Quantum Communications and Quantum Imaging: Volume VIII: 2, 4-5 August 2010, San Diego, California, United States
