We can't find the internet
Attempting to reconnect
Something went wrong!
Hang in there while we get back on track
£90.50
Nonlinear Optics and Applications III (Proceedings of SPIE): v. 7354
Price data last checked 70 day(s) ago - refreshing...
We'll watch every seller, every day. One email when your price arrives.
It has never been this cheap. We have no record of a lower price.
£91 today · cheaper than every other day in the last 3 months
NEW HERE?
Amazon shows you one price. We show you all of them.
Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.
WHAT'S ON THIS PAGE
when this has been cheap or pricey
where the price is heading next
all-time high & low, recent range
name your number, we'll email you
Price History & Forecast
Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.
Last 21 days • 21 data points (No recent data available)
Price Distribution
Price distribution over 21 days • 1 price levels
Price Analysis
Most common price: £91 (21 days, 100.0%)
Price range: £91 - £91
Price levels: 1 different prices over 21 days
Product Specifications
- Format
- Paperback
- ASIN
- 0819476285
- Domain
- Amazon UK
- Release Date
- 15 August 2009
- Listed Since
- 16 February 2009
Barcode
No barcode data available
Similar Products You Might Like
Optical Pattern Recognition XX (Proceedings of SPIE): v. 7340
Complex Light and Optical Forces III (Proceedings of SPIE): v. 7227
Optical Fabrication, Testing, and Metrology III: 3 (Proceedings of SPIE)
Photonic Microdevices/microstructures for Sensing (Proceedings of SPIE): v. 7322
Optoelectronic Devices: Physics, Fabrication, and Application III (Proceedings of SPIE)
Fiber Optic Sensors and Applications VI (Proceedings of SPIE): v. 7316
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment (Proceedings of SPIE)
VLSI Circuits and Systems IV (Proceedings of SPIE): v. 7363
Optical Diagnostics and Sensing IX (Proceedings of SPIE): v. 7186
Optical Components and Materials VI (Proceedings of SPIE): v. 7212
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies (Proceedings of SPIE)
Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies III: 3 (Proceedings of SPIE)
Optics for Natural Resources, Agriculture, and Foods II (Proceedings of SPIE)
Integrated Optics: Devices, Materials, and Technologies XII: 12 (Proceedings of SPIE)
International Conference on Optical Instruments and Technology 2008: Optical Systems and Optoelectronic Instruments (Proceedings of Spie)
Optical Materials and Structures Technologies III: 3 (Proceedings of SPIE)
Optical Components and Materials III (Proceedings of SPIE)
Optical Modeling and Performance Predictions III: 3 (Proceedings of SPIE)
Advanced Materials and Devices for Sensing and Imaging III: 3 (Proceedings of SPIE)
Linear and Nonlinear Optics of Organic Materials VII: 7 (Proceedings of SPIE)
Optical Transmission, Switching, and Subsystems IV (Proceedings of SPIE)
Technologies for Optical Countermeasures III: 3 (Proceedings of SPIE)
