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Ninth International Symposium on Laser Metrology (Proceedings of SPIE)

Applied Optics

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Description

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Product Specifications

Format: paperback
ASIN: 0819473987
Category: Books > Subjects > Science, Nature & Maths > Engineering & Technology > Electronics & Communications Engineering > Electronics Engineering > Applied Optics
Domain: Amazon UK
Release Date: 02 October 2008
Listed Since: 16 February 2009

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Ninth International Symposium on Laser Metrology (Proceedings of SPIE)

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