We can't find the internet
Attempting to reconnect
Something went wrong!
Hang in there while we get back on track
£115.00
Instrumentation, Metrology, and Standards for Nanomanufacturing (Proceedings of SPIE)
Price data last checked 151 day(s) ago - refreshing...
We'll watch every seller, every day. One email when your price arrives.
It has never been this cheap. We have no record of a lower price.
£115 today · cheaper than every other day in the last 24 months
NEW HERE?
Amazon shows you one price. We show you all of them.
Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.
WHAT'S ON THIS PAGE
when this has been cheap or pricey
where the price is heading next
all-time high & low, recent range
name your number, we'll email you
Price History & Forecast
Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.
Last 580 days • 580 data points (No recent data available)
Price Distribution
Price distribution over 580 days • 1 price levels
Price Analysis
Most common price: £115 (580 days, 100.0%)
Price range: £115 - £115
Price levels: 1 different prices over 580 days
Product Specifications
- Format
- paperback
- ASIN
- 0819467960
- Category
- Books > Subjects > Science, Nature & Maths > Engineering & Technology > Electrical > Nanotechnology
- Domain
- Amazon UK
- Release Date
- 10 September 2007
- Listed Since
- 25 February 2009
Barcode
No barcode data available
Similar Products You Might Like
Instrumentation, Metrology, and Standards for Nanomanufacturing II (Proceedings of SPIE)
Nano- and Micro-metrology (Proceedings of SPIE)
Nanomaterial Synthesis and Integration for Sensors, Electronics, Photonics, and Electro-optics (Proceedings of SPIE)
Optomechatronic Micro/nano Devices and Components (Proceedings of SPIE)
Micro (mems) and Nanotechnologies for Space Applications (Proceedings of SPIE)
Nanophotonics and Macrophotonics for Space Environments (Proceedings of SPIE)
Buildings for Nanoscale Research and Beyond (Proceedings of SPIE)
Nanophotonics, Nanostructure, and Nanometrology II (Proceedings of SPIE)
Optical Micro- and Nanometrology in Microsystems Technology (Proceedings of SPIE)
Optomechatronic Sensors, Instrumentation, and Computer-vision Systems (Proceedings of SPIE)
Design for Manufacturability Through Design-process Integration (Proceedings of SPIE)
Integrated Optics, Silicon Photonics, and Photonic Integrated Circuits (Proceedings of SPIE)
Metrology, Inspection, and Process Control for Microlithography XXII (Proceedings of SPIE)
Microfluidics and BioMEMS (Proceedings of SPIE)
Millimetre Wave and Terahertz Sensors and Technology (Proceedings of SPIE)
Ultrafast Nonlinear Imaging and Spectroscopy (Proceedings of SPIE)
Carbon Nanotubes and Associated Devices (Proceedings of SPIE)
Micro (MEMS) and Nanotechnologies for Space, Defense, and Security II (Proceedings of SPIE)
Organic-based Chemical and Biological Sensors (Proceedings of SPIE)
Nanotubes and Nanowires (Proceedings of SPIE)