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Two- and Three-dimensional Methods for Inspection and Metrology III: 3 (SPIE Conference Proceedings) (Proceedings of SPIE)

Quality Assurance & Total Quality Management

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Description

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Product Specifications

Format: Paperback
ASIN: 0819460249
Category: Books > Subjects > Business, Finance & Law > Management > Quality Assurance & Total Quality Management
Domain: Amazon UK
Release Date: 01 December 2005
Listed Since: 04 January 2007

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Two- and Three-dimensional Methods for Inspection and Metrology III: 3 (SPIE Conference Proceedings) (Proceedings of SPIE)

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