£115.00

Two- and Three-dimensional Methods for Inspection and Metrology III: 3 (SPIE Conference Proceedings) (Proceedings of SPIE)

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Description

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields.  Proceedings of SPIE are among the most cited references in patent literature.

Product Specifications

Format
paperback
Domain
Amazon UK
Release Date
01 December 2005
Listed Since
04 January 2007

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