£115.00

Image Processing and Pattern Recognition in Remote Sensing II: 0 (Proceedings of SPIE): 8-9 November 2004, Honolulu, Hawaii, USA

Higher Education

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Description

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

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Format: paperback
ASIN: 0819456187
Category: Books > Subjects > Science, Nature & Maths > Earth Sciences > Education > Higher Education
Domain: Amazon UK
Release Date: 31 January 2005
Listed Since: 04 January 2007

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Image Processing and Pattern Recognition in Remote Sensing II: 0 (Proceedings of SPIE): 8-9 November 2004, Honolulu, Hawaii, USA

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