We can't find the internet
Attempting to reconnect
Something went wrong!
Hang in there while we get back on track
£115.00
Process and Materials Characterization and Diagnostics in IC Manufacturing: II (Proceedings of SPIE)
Price data last checked 38 day(s) ago - refreshing...
We'll watch every seller, every day. One email when your price arrives.
It has never been this cheap. We have no record of a lower price.
£115 today · cheaper than every other day in the last 3 months
NEW HERE?
Amazon shows you one price. We show you all of them.
Tosheroon watches Amazon prices so you don't have to. Every product on Amazon has a price history — we make it visible. Set the price you'd actually pay, and we'll email you the second it gets there. No app, no account, one email.
WHAT'S ON THIS PAGE
when this has been cheap or pricey
where the price is heading next
all-time high & low, recent range
name your number, we'll email you
Price History & Forecast
Grey patches = out of stock. Cheaper = lower on the chart. Hover for exact prices.
Last 53 days • 53 data points (No recent data available)
Price Distribution
Price distribution over 53 days • 1 price levels
Price Analysis
Most common price: £115 (53 days, 100.0%)
Price range: £115 - £115
Price levels: 1 different prices over 53 days
Product Specifications
- Format
- paperback
- ASIN
- 081944846X
- Category
- Books > Subjects > Computing & Internet > Computer Science > Architecture & Microprocessors
- Domain
- Amazon UK
- Release Date
- 31 July 2003
- Listed Since
- 04 January 2007
Barcode
No barcode data available
Similar Products You Might Like
Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies II (Proceedings of SPIE)
Noise in Devices and Circuits II (Proceedings of SPIE)
Design and Microfabrication of Novel X-Ray Optics: II (Proceedings of SPIE): 2
Intelligent Integrated Microsystems (Proceedings of SPIE)
Image Processing: Machine Vision Applications (Proceedings of SPIE)
Silicon Photonics (Proceedings of SPIE)
Optical Diagnostics (Proceedings of SPIE)
Quantum Sensing and Nanophotonic Devices II (Proceedings of SPIE)
Second International Conference on Advanced Optoelectronics and Lasers (Proceedings of SPIE)
Microelectronics: Design, Technology, and Packaging II (Proceedings of SPIE)
Photonics Applications in Astronomy, Communications, Industry, and High-energy Physics Experiments II (Proceedings of SPIE)
Nanocoatings (Proceedings of SPIE)
Energy Harvesting and Storage: Materials, Devices, and Applications II
Infrared Sensors, Devices, and Applications: Volume II
Second International Conference on Space Information Technology (Proceedings of SPIE)
Space Exploration Technologies (Proceedings of SPIE)
Noise and Information in Nanoelectronics, Sensors and Standards (Proceedings of SPIE)
Optical Components and Materials II: 2 (Proceedings of SPIE)
Device and Process Technologies for MEMS ,Microelectronics, and Photonics III (Proceedings of S P I E)
Biosensing (Proceedings of SPIE)
Nanobiosystems: Processing, Characterization, and Applications (Proceedings of SPIE)
Advances in Optical Thin Films (Proceedings of SPIE)
Microelectronics: Design, Technology, and Packaging III: 3 (Proceedings of SPIE)