Thin Film Materials: Stress, Defect Formation and Surface Evolution - Image 1

£76.99

Cambridge University Press Thin Film Materials: Stress, Defect Formation and Surface Evolution

Name: Thin Film Materials: Stress, Defect Formation and Surface Evolution
Brand: Cambridge University Press
Price: 76.99 GBP
Availability: InStock

Materials Science

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Description

Thin film mechanical behavior and stress presents a technological challenge for materials scientists, physicists and engineers. This book provides a comprehensive coverage of the major issues and topics dealing with stress, defect formation, surface evolution and allied effects in thin film materials. Physical phenomena are examined from the continuum down to the sub-microscopic length scales, with the connections between the structure of the material and its behavior described. Theoretical concepts are underpinned by discussions on experimental methodology and observations. Fundamental scientific concepts are embedded through sample calculations, a broad range of case studies with practical applications, thorough referencing, and end of chapter problems. With solutions to problems available on-line, this book will be essential for graduate courses on thin films and the classic reference for researchers in the field.

Product Specifications

Brand: Cambridge University Press
Format: hardcover
ASIN: 0521822815
Category: Books > Subjects > Science, Nature & Maths > Engineering & Technology > Mechanical & Materials Engineering > Materials Science
Domain: Amazon UK
Release Date: 08 January 2004
Listed Since: 05 February 2007

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Cambridge University Press Thin Film Materials: Stress, Defect Formation and Surface Evolution

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