Characterization of High Tc Materials and Devices by Electron Microscopy - Image 1

£45.99

Cambridge University Press Characterization of High Tc Materials and Devices by Electron Microscopy

Name: Characterization of High Tc Materials and Devices by Electron Microscopy
Brand: Cambridge University Press
Price: 45.99 GBP
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Engineering Physics

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Description

This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques, and microanalysis by scanning transmission electron microscopy. Ensuing chapters examine identification of superconducting compounds, imaging of superconducting properties by low-temperature scanning electron microscopy, imaging of vortices by electron holography and electronic structure determination by electron energy loss spectroscopy. The use of scanning tunnelling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier distributions is discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device structures. Detailed references are included.

Product Specifications

Brand: Cambridge University Press
Format: paperback
ASIN: 0521031702
Category: Books > Subjects > Science, Nature & Maths > Engineering & Technology > Engineering Physics
Domain: Amazon UK
Release Date: 23 November 2006
Listed Since: 15 December 2006

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Cambridge University Press Characterization of High Tc Materials and Devices by Electron Microscopy

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