Fundamentals of Microstructural Characterization of Materials - Image 1

£105.39

Elsevier Fundamentals of Microstructural Characterization of Materials

Name: Fundamentals of Microstructural Characterization of Materials
Brand: Elsevier
Price: 105.39 GBP
Availability: InStock

Materials Science

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Description

Fundamentals of Microstructure Characterization of Materials is an essential resource for understanding the various techniques and methods used in material characterization. This book delves into spectroscopic methods involving electromagnetic radiation, X-ray photoelectron analysis, atomic emission spectroscopy, and more. It provides thorough explanations of scanning electron microscopy and sample preparation techniques, including cutting, grinding, polishing, and etching. Other important points covered in the book include microscopy fundamentals such as lens types, optical image formation principles, depth of field, and depth of focus. Statistical analysis methods, including cumulative distribution function, probability density function, and Gaussian distribution, are also discussed. Additionally, the application of X-ray diffraction in phase analysis of materials is explored in detail. Covers a wide range of concepts and techniques for the accurate characterization of the microstructure of a variety of materials, including metals, ceramics, and polymers Outlines spectroscopic, scanning electron microscope, X-ray diffraction, and other characterization methods Discusses microscopy fundamentals, statistical analysis, and sample preparation methods

Product Specifications

Brand: Elsevier
Format: paperback
ASIN: 0443341893
Category: Books > Subjects > Science, Nature & Maths > Engineering & Technology > Mechanical & Materials Engineering > Materials Science
Domain: Amazon UK
Release Date: 21 November 2025
Listed Since: 05 February 2025

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Elsevier Fundamentals of Microstructural Characterization of Materials

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