CRC Press Applied Mathematical Modeling: A Multidisciplinary Approach (Discrete Mathematics and Its Applications)

The practice of modeling is best learned by those armed with fundamental methodologies and exposed to a wide variety of modeling experience. Ideally, this experience could be obtained by working on actual modeling problems. But time constraints often make this difficult. Applied Mathematical Modeling provides a collection of models illustrating the power and richness of the mathematical sciences in supplying insight into the operation of important real-world systems. It fills a gap within modeling texts, focusing on applications across a broad range of disciplines. The first part of the book discusses the general components of the modeling process and highlights the potential of modeling in practice. These chapters discuss the general components of the modeling process, and the evolutionary nature of successful model building. The second part provides a rich compendium of case studies, each one complete with examples, exercises, and projects.In keeping with the multidimensional nature of the models presented, the chapters in the second part are listed in alphabetical order by the contributor's last name. Unlike most mathematical books, in which you must master the concepts of early chapters to prepare for subsequent material, you may start with any chapter. Begin with cryptology, if that catches your fancy, or go directly to bursty traffic if that is your cup of tea.Applied Mathematical Modeling serves as a handbook of in-depth case studies that span the mathematical sciences, building upon a modest mathematical background. Readers in other applied disciplines will benefit from seeing how selected mathematical modeling philosophies and techniques can be brought to bear on problems in their disciplines. The models address actual situations studied in chemistry, physics, demography, economics, civil engineering, environmental engineering, industrial engineering, telecommunications, and other areas. About the Author D. R. Shier, K. T. Wallenius