Academic Press Principles of Electron Optics, Volume 3: Fundamental Wave Optics

Product Description Principles of Electron Optic: Volume Three: Wave Optics, discusses this essential topic in microscopy to help readers understand the propagation of electrons from the source to the specimen, and through the latter (and from it) to the image plane of the instrument. In addition, it also explains interference phenomena, notably holography, and informal coherence theory. This third volume accompanies volumes one and two that cover new content on holography and interference, improved and new modes of image formation, aberration corrected imaging, simulation, and measurement, 3D-reconstruction, and more. The study of such beams forms the subject of electron optics, which divides naturally into geometrical optics where effects due to wavelength are neglected, with wave optics considered. Review The authoritative reference on the fundamental understanding of, and recent advances in, research on wave optics From the Back Cover The behaviour of beams of free electrons, released from a source and propagating through a vacuum region in some device, is of interest in many diverse fields of instrumentation and technology. The study of such beams forms the subject of electron optics, which divides naturally into geometrical optics, where effects due to wavelength are neglected, and wave optics, where these effects are considered. Volumes 1 and 2 were devoted to geometrical optics. This final volume, <i>Principles of Electron Optic: Volume 3: Wave Optics</i> is concerned with wave optics. A knowledge of this branch of the subject is essential in microscopy, to understand the propagation of electrons from the source to the specimen, through the latter and from it to the image plane of the instrument. It is also needed to explain all interference phenomena, notably holography, and in formal coherence theory.The second edition is revised throughout with new content on holography and interference, improved and new modes of image formation, aberration corrected imaging, simulation, and measurement, and 3D-reconstruction. About the Author Professor Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peter House and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Optical Society of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics. Erwin Kasper studied physics at the Universities of Münster and Tübingen (Germany), where he obtained his PhD in 1965 and the habilitation to teach physics in 1969. After scientific spells in the University of Tucson, Arizona (1966) and in Munich (1970), he resumed his research and teaching in the Institute of Applied Physics, University of Tübingen, where he was later appointed professor. He lectured on general physics and especially on electron optics. The subject of his research was theoretical electron optics and related numerical methods on which he published numerous papers. After his retirement in 1997, he published a book on numerical field calculation (2001).